Wednesday, February 10, 2021 at 11:00:00 AM Virtual Meetup

Please register to attend:

Every quarter, our analytics experts present a 30-minute update to our virtual user community. This quarter we will include a demo on how to identify and classify patterns of interest in big data, which is a critical part of any manufacturing scenario.

Join the live discussion with Chief Analytics Officer, Michael O'Connell, and the TIBCO Data Science Team.

You'll learn about:
- Recent innovation projects and community activities
- TIBCO's novel approach to pattern recognition as applied to semiconductor wafer maps
- How to use a combination of machine learning techniques and to identify patterns quickly and accurately from a large amount of data
- How to use these patterns to train and deploy a model to classify new wafers in real-time

Michael O'Connell, Chief Analytics Officer, TIBCO Software
Heleen Snelting, Director, Data Science, TIBCO Software
Nico Rode, Senior Data Scientist, TIBCO Software
Adam Faskowitz, Data Scientist, TIBCO Software

Click here for event

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